YAG(Ce) Scintillator Crystals
High light yield (8000Ph/MeV), fast decay time (70ns)
Good Mechanical Properties and Thermal Conductivity
Maximum diameter: up to 4 inches
Coating Optional: Al, Ag, Au, and Protective SiO2 Layer
Applications: SEM, Ultra-thin imaging Screens, Electron Imaging, Beta Ray and X-ray Counter, Ion Beam Imaging
Thin Ce: YAG Screens are also available: minimum thickness 0.01mm with substrates, 0.05mm freestanding
Physical and Chemical Properties:
Crystal Structure | Cubic | Lattice Constant | 12.01 Å |
Melting Point | 1970℃ | Mohs Hardness | 8.5 |
Density | 4.56±0.04g/cm3 | Specific Heat | 0.59J/g.cm3@0-20℃ |
Elastic Modulus | 310GPa | Young’s Modulus | 3.17×10^4Kg/mm2 |
Poisson’s Ratio | 0.3 | Tensile Strength | 0.13~0.26GPa |
Thermal Expansion | [100]:8.2×10-^6/℃@ 0~250℃ | Thermo-optic Coeffic ient(dn/dT) | 7.3×10^-6/℃ |
[110]:7.7×10^-6/℃@0~250℃ | |||
[111]:7.8×10^-6/℃@0~250℃ | |||
Thermal Conductivity | 14W/m/K@20°C | Thermal Shock Resi stance | 790W/m |
10.5W/m/K@100°C | |||
Solubility | Insoluble in water, slightly soluble in acids. | ||
Scintillation Properties:
Emission Peak (nm) | 530 | Light Output (Photons/MeV) | 8000 |
Effective Atomic Number (Zeff) | 35 | Decay Time (ns) | 70 |
Quality Factor (LR/t) | 138.5 |
Specifications:
Growth Method | Czochralski | Formula | |
Maximum Dimension | Max. Diameter 4" | Crystal Structure |